It's the Art of Failure Analysis photo comp
Fresh from Singapore's International Symposium on the Physical and Failure Analysis of Integrated Circuits comes a fascinating selection of images which were entered into, yes, the conference's annual photography competition...
The winning image was by Lim Saw Sing of Infineon Technologies in Malaysia, who won first prize for the above picture of what could well be a large group of people cavorting on a beach (and clearly on drugs). It's actually a scanning electron microscope image of what happened when Sing "exposed a polyimide surface to etching by reactive ions".
Tan Lee Koon of Systems-on-Silicon Manufacturing Co. took third prize with this image of the chipping at the edge of a silicon wafer, examined under a scanning electron microscope
According to the IEEE, the professional association for "the advancement of technology" which organises the symposium, Singapore has one of the largest concentrations of microelectronics technology expertise in Asia.
Flocking to its IPFA conference are a legion of "researchers, engineers, technicians and others who work in the area of Failure Analysis in Wafer FAB, Packages, Board Assembly and Service Labs."
While we're not entirely sure what that means (though 'failure analysis' is essentially the process of finding out why a particular electronic component fails to work), we do very much like the idea of their photography competition in which images are submitted taken by people working with extremely high powered microscopes.
According to point three of the rules of the photo competition, "The main judging criterion would be the aesthetic aspect of the image rather than its technical quality to be in line with the theme of the contest. Nevertheless, the image must be related to failure analysis."
In no particular order, then, here are some of our other favourites from this year's competition.
This is Lim Chan Way at Infineon Technologies' picture of a membrane structure (top) sticking to a piece of carbon tape:
This image of what appears to be a set of wings is by Advanced Micro Devices analyst, Foo Fang Jie, who was looking at a fracture in a sample of silicon at the time. It won second prize.
And these scientists are not without a sense of humour in pursuit of lovely imagery. Here's Jacqueline Kwa at Advanced Micro Devices' transmission electron microscope picture of a rather elephantine silicon sample:
Finally, Khoo Bing Sheng took this image of a 20-micrometer-wide sculpture made from copper (using focused-ion-beam nano fabrication) at WinTech Nano-Technology.
The full list of winning work is at the IEEE's Spectrum website, spectrum.ieee.org.
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Love the winner!! First when I sore it I thought it was done with a brush and wow! It's darn dang amazing however it was done! Hats off!
Great post you have here. After reading your post, a thought came into my mind which is why artist must join on-line art competition. I guess my thought may be helpful too.
The image of the copper sculpture is absolutely amazing, the question is, how did they do that? I also love the carbon tape and membrane structure image, it reminds me of walking through a wood on a foggy night with a torch. Great images as always CR, testing the boundaries of what is really creative in photography.
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